National Instruments has announced the expansion of its line of PXI SMUs for automated semiconductor test. Ideal for parallel testing of multipin semiconductor DUTs, the new NI PXIe-4143 SMU offers 600,000 samples per second and four channels – the highest channel density of any SMU – and expands NI’s multichannel SMU output range to 24 V at 150 mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device stated by Ron Wolfe, vice president of semiconductor test at National Instruments.
- Four SMU channels with up to 600 kS/s sampling rate to measure fast transient responses
- Four-quadrant output capability of 24 V at 150 mA, complementing preexisting NI SMU capabilities for sourcing and sinking
- Measurement sensitivity of 10 pA
- Flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments
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